mirror of
				https://github.com/smaeul/u-boot.git
				synced 2025-10-31 20:18:18 +00:00 
			
		
		
		
	
		
			
				
	
	
		
			470 lines
		
	
	
		
			17 KiB
		
	
	
	
		
			C
		
	
	
	
	
	
			
		
		
	
	
			470 lines
		
	
	
		
			17 KiB
		
	
	
	
		
			C
		
	
	
	
	
	
| /*
 | |
|  *  linux/include/linux/mtd/nand.h
 | |
|  *
 | |
|  *  Copyright (c) 2000 David Woodhouse <dwmw2@mvhi.com>
 | |
|  *		       Steven J. Hill <sjhill@realitydiluted.com>
 | |
|  *		       Thomas Gleixner <tglx@linutronix.de>
 | |
|  *
 | |
|  * $Id: nand.h,v 1.68 2004/11/12 10:40:37 gleixner Exp $
 | |
|  *
 | |
|  * This program is free software; you can redistribute it and/or modify
 | |
|  * it under the terms of the GNU General Public License version 2 as
 | |
|  * published by the Free Software Foundation.
 | |
|  *
 | |
|  *  Info:
 | |
|  *   Contains standard defines and IDs for NAND flash devices
 | |
|  *
 | |
|  *  Changelog:
 | |
|  *   01-31-2000 DMW	Created
 | |
|  *   09-18-2000 SJH	Moved structure out of the Disk-On-Chip drivers
 | |
|  *			so it can be used by other NAND flash device
 | |
|  *			drivers. I also changed the copyright since none
 | |
|  *			of the original contents of this file are specific
 | |
|  *			to DoC devices. David can whack me with a baseball
 | |
|  *			bat later if I did something naughty.
 | |
|  *   10-11-2000 SJH	Added private NAND flash structure for driver
 | |
|  *   10-24-2000 SJH	Added prototype for 'nand_scan' function
 | |
|  *   10-29-2001 TG	changed nand_chip structure to support
 | |
|  *			hardwarespecific function for accessing control lines
 | |
|  *   02-21-2002 TG	added support for different read/write adress and
 | |
|  *			ready/busy line access function
 | |
|  *   02-26-2002 TG	added chip_delay to nand_chip structure to optimize
 | |
|  *			command delay times for different chips
 | |
|  *   04-28-2002 TG	OOB config defines moved from nand.c to avoid duplicate
 | |
|  *			defines in jffs2/wbuf.c
 | |
|  *   08-07-2002 TG	forced bad block location to byte 5 of OOB, even if
 | |
|  *			CONFIG_MTD_NAND_ECC_JFFS2 is not set
 | |
|  *   08-10-2002 TG	extensions to nand_chip structure to support HW-ECC
 | |
|  *
 | |
|  *   08-29-2002 tglx	nand_chip structure: data_poi for selecting
 | |
|  *			internal / fs-driver buffer
 | |
|  *			support for 6byte/512byte hardware ECC
 | |
|  *			read_ecc, write_ecc extended for different oob-layout
 | |
|  *			oob layout selections: NAND_NONE_OOB, NAND_JFFS2_OOB,
 | |
|  *			NAND_YAFFS_OOB
 | |
|  *  11-25-2002 tglx	Added Manufacturer code FUJITSU, NATIONAL
 | |
|  *			Split manufacturer and device ID structures
 | |
|  *
 | |
|  *  02-08-2004 tglx	added option field to nand structure for chip anomalities
 | |
|  *  05-25-2004 tglx	added bad block table support, ST-MICRO manufacturer id
 | |
|  *			update of nand_chip structure description
 | |
|  */
 | |
| #ifndef __LINUX_MTD_NAND_H
 | |
| #define __LINUX_MTD_NAND_H
 | |
| 
 | |
| #include <linux/mtd/compat.h>
 | |
| #include <linux/mtd/mtd.h>
 | |
| 
 | |
| struct mtd_info;
 | |
| /* Scan and identify a NAND device */
 | |
| extern int nand_scan (struct mtd_info *mtd, int max_chips);
 | |
| /* Free resources held by the NAND device */
 | |
| extern void nand_release (struct mtd_info *mtd);
 | |
| 
 | |
| /* Read raw data from the device without ECC */
 | |
| extern int nand_read_raw (struct mtd_info *mtd, uint8_t *buf, loff_t from, size_t len, size_t ooblen);
 | |
| 
 | |
| 
 | |
| /* This constant declares the max. oobsize / page, which
 | |
|  * is supported now. If you add a chip with bigger oobsize/page
 | |
|  * adjust this accordingly.
 | |
|  */
 | |
| #define NAND_MAX_OOBSIZE	64
 | |
| 
 | |
| /*
 | |
|  * Constants for hardware specific CLE/ALE/NCE function
 | |
| */
 | |
| /* Select the chip by setting nCE to low */
 | |
| #define NAND_CTL_SETNCE		1
 | |
| /* Deselect the chip by setting nCE to high */
 | |
| #define NAND_CTL_CLRNCE		2
 | |
| /* Select the command latch by setting CLE to high */
 | |
| #define NAND_CTL_SETCLE		3
 | |
| /* Deselect the command latch by setting CLE to low */
 | |
| #define NAND_CTL_CLRCLE		4
 | |
| /* Select the address latch by setting ALE to high */
 | |
| #define NAND_CTL_SETALE		5
 | |
| /* Deselect the address latch by setting ALE to low */
 | |
| #define NAND_CTL_CLRALE		6
 | |
| /* Set write protection by setting WP to high. Not used! */
 | |
| #define NAND_CTL_SETWP		7
 | |
| /* Clear write protection by setting WP to low. Not used! */
 | |
| #define NAND_CTL_CLRWP		8
 | |
| 
 | |
| /*
 | |
|  * Standard NAND flash commands
 | |
|  */
 | |
| #define NAND_CMD_READ0		0
 | |
| #define NAND_CMD_READ1		1
 | |
| #define NAND_CMD_PAGEPROG	0x10
 | |
| #define NAND_CMD_READOOB	0x50
 | |
| #define NAND_CMD_ERASE1		0x60
 | |
| #define NAND_CMD_STATUS		0x70
 | |
| #define NAND_CMD_STATUS_MULTI	0x71
 | |
| #define NAND_CMD_SEQIN		0x80
 | |
| #define NAND_CMD_READID		0x90
 | |
| #define NAND_CMD_ERASE2		0xd0
 | |
| #define NAND_CMD_RESET		0xff
 | |
| 
 | |
| /* Extended commands for large page devices */
 | |
| #define NAND_CMD_READSTART	0x30
 | |
| #define NAND_CMD_CACHEDPROG	0x15
 | |
| 
 | |
| /* Status bits */
 | |
| #define NAND_STATUS_FAIL	0x01
 | |
| #define NAND_STATUS_FAIL_N1	0x02
 | |
| #define NAND_STATUS_TRUE_READY	0x20
 | |
| #define NAND_STATUS_READY	0x40
 | |
| #define NAND_STATUS_WP		0x80
 | |
| 
 | |
| /*
 | |
|  * Constants for ECC_MODES
 | |
|  */
 | |
| 
 | |
| /* No ECC. Usage is not recommended ! */
 | |
| #define NAND_ECC_NONE		0
 | |
| /* Software ECC 3 byte ECC per 256 Byte data */
 | |
| #define NAND_ECC_SOFT		1
 | |
| /* Hardware ECC 3 byte ECC per 256 Byte data */
 | |
| #define NAND_ECC_HW3_256	2
 | |
| /* Hardware ECC 3 byte ECC per 512 Byte data */
 | |
| #define NAND_ECC_HW3_512	3
 | |
| /* Hardware ECC 6 byte ECC per 512 Byte data */
 | |
| #define NAND_ECC_HW6_512	4
 | |
| /* Hardware ECC 8 byte ECC per 512 Byte data */
 | |
| #define NAND_ECC_HW8_512	6
 | |
| /* Hardware ECC 12 byte ECC per 2048 Byte data */
 | |
| #define NAND_ECC_HW12_2048	7
 | |
| 
 | |
| /*
 | |
|  * Constants for Hardware ECC
 | |
| */
 | |
| /* Reset Hardware ECC for read */
 | |
| #define NAND_ECC_READ		0
 | |
| /* Reset Hardware ECC for write */
 | |
| #define NAND_ECC_WRITE		1
 | |
| /* Enable Hardware ECC before syndrom is read back from flash */
 | |
| #define NAND_ECC_READSYN	2
 | |
| 
 | |
| /* Option constants for bizarre disfunctionality and real
 | |
| *  features
 | |
| */
 | |
| /* Chip can not auto increment pages */
 | |
| #define NAND_NO_AUTOINCR	0x00000001
 | |
| /* Buswitdh is 16 bit */
 | |
| #define NAND_BUSWIDTH_16	0x00000002
 | |
| /* Device supports partial programming without padding */
 | |
| #define NAND_NO_PADDING		0x00000004
 | |
| /* Chip has cache program function */
 | |
| #define NAND_CACHEPRG		0x00000008
 | |
| /* Chip has copy back function */
 | |
| #define NAND_COPYBACK		0x00000010
 | |
| /* AND Chip which has 4 banks and a confusing page / block
 | |
|  * assignment. See Renesas datasheet for further information */
 | |
| #define NAND_IS_AND		0x00000020
 | |
| /* Chip has a array of 4 pages which can be read without
 | |
|  * additional ready /busy waits */
 | |
| #define NAND_4PAGE_ARRAY	0x00000040
 | |
| 
 | |
| /* Options valid for Samsung large page devices */
 | |
| #define NAND_SAMSUNG_LP_OPTIONS \
 | |
| 	(NAND_NO_PADDING | NAND_CACHEPRG | NAND_COPYBACK)
 | |
| 
 | |
| /* Macros to identify the above */
 | |
| #define NAND_CANAUTOINCR(chip) (!(chip->options & NAND_NO_AUTOINCR))
 | |
| #define NAND_MUST_PAD(chip) (!(chip->options & NAND_NO_PADDING))
 | |
| #define NAND_HAS_CACHEPROG(chip) ((chip->options & NAND_CACHEPRG))
 | |
| #define NAND_HAS_COPYBACK(chip) ((chip->options & NAND_COPYBACK))
 | |
| 
 | |
| /* Mask to zero out the chip options, which come from the id table */
 | |
| #define NAND_CHIPOPTIONS_MSK	(0x0000ffff & ~NAND_NO_AUTOINCR)
 | |
| 
 | |
| /* Non chip related options */
 | |
| /* Use a flash based bad block table. This option is passed to the
 | |
|  * default bad block table function. */
 | |
| #define NAND_USE_FLASH_BBT	0x00010000
 | |
| /* The hw ecc generator provides a syndrome instead a ecc value on read
 | |
|  * This can only work if we have the ecc bytes directly behind the
 | |
|  * data bytes. Applies for DOC and AG-AND Renesas HW Reed Solomon generators */
 | |
| #define NAND_HWECC_SYNDROME	0x00020000
 | |
| 
 | |
| 
 | |
| /* Options set by nand scan */
 | |
| /* Nand scan has allocated oob_buf */
 | |
| #define NAND_OOBBUF_ALLOC	0x40000000
 | |
| /* Nand scan has allocated data_buf */
 | |
| #define NAND_DATABUF_ALLOC	0x80000000
 | |
| 
 | |
| 
 | |
| /*
 | |
|  * nand_state_t - chip states
 | |
|  * Enumeration for NAND flash chip state
 | |
|  */
 | |
| typedef enum {
 | |
| 	FL_READY,
 | |
| 	FL_READING,
 | |
| 	FL_WRITING,
 | |
| 	FL_ERASING,
 | |
| 	FL_SYNCING,
 | |
| 	FL_CACHEDPRG,
 | |
| } nand_state_t;
 | |
| 
 | |
| /* Keep gcc happy */
 | |
| struct nand_chip;
 | |
| 
 | |
| #if 0
 | |
| /**
 | |
|  * struct nand_hw_control - Control structure for hardware controller (e.g ECC generator) shared among independend devices
 | |
|  * @lock:		protection lock
 | |
|  * @active:		the mtd device which holds the controller currently
 | |
|  */
 | |
| struct nand_hw_control {
 | |
| 	spinlock_t	 lock;
 | |
| 	struct nand_chip *active;
 | |
| };
 | |
| #endif
 | |
| 
 | |
| /**
 | |
|  * struct nand_chip - NAND Private Flash Chip Data
 | |
|  * @IO_ADDR_R:		[BOARDSPECIFIC] address to read the 8 I/O lines of the flash device
 | |
|  * @IO_ADDR_W:		[BOARDSPECIFIC] address to write the 8 I/O lines of the flash device
 | |
|  * @read_byte:		[REPLACEABLE] read one byte from the chip
 | |
|  * @write_byte:		[REPLACEABLE] write one byte to the chip
 | |
|  * @read_word:		[REPLACEABLE] read one word from the chip
 | |
|  * @write_word:		[REPLACEABLE] write one word to the chip
 | |
|  * @write_buf:		[REPLACEABLE] write data from the buffer to the chip
 | |
|  * @read_buf:		[REPLACEABLE] read data from the chip into the buffer
 | |
|  * @verify_buf:		[REPLACEABLE] verify buffer contents against the chip data
 | |
|  * @select_chip:	[REPLACEABLE] select chip nr
 | |
|  * @block_bad:		[REPLACEABLE] check, if the block is bad
 | |
|  * @block_markbad:	[REPLACEABLE] mark the block bad
 | |
|  * @hwcontrol:		[BOARDSPECIFIC] hardwarespecific function for accesing control-lines
 | |
|  * @dev_ready:		[BOARDSPECIFIC] hardwarespecific function for accesing device ready/busy line
 | |
|  *			If set to NULL no access to ready/busy is available and the ready/busy information
 | |
|  *			is read from the chip status register
 | |
|  * @cmdfunc:		[REPLACEABLE] hardwarespecific function for writing commands to the chip
 | |
|  * @waitfunc:		[REPLACEABLE] hardwarespecific function for wait on ready
 | |
|  * @calculate_ecc:	[REPLACEABLE] function for ecc calculation or readback from ecc hardware
 | |
|  * @correct_data:	[REPLACEABLE] function for ecc correction, matching to ecc generator (sw/hw)
 | |
|  * @enable_hwecc:	[BOARDSPECIFIC] function to enable (reset) hardware ecc generator. Must only
 | |
|  *			be provided if a hardware ECC is available
 | |
|  * @erase_cmd:		[INTERN] erase command write function, selectable due to AND support
 | |
|  * @scan_bbt:		[REPLACEABLE] function to scan bad block table
 | |
|  * @eccmode:		[BOARDSPECIFIC] mode of ecc, see defines
 | |
|  * @eccsize:		[INTERN] databytes used per ecc-calculation
 | |
|  * @eccbytes:		[INTERN] number of ecc bytes per ecc-calculation step
 | |
|  * @eccsteps:		[INTERN] number of ecc calculation steps per page
 | |
|  * @chip_delay:		[BOARDSPECIFIC] chip dependent delay for transfering data from array to read regs (tR)
 | |
|  * @chip_lock:		[INTERN] spinlock used to protect access to this structure and the chip
 | |
|  * @wq:			[INTERN] wait queue to sleep on if a NAND operation is in progress
 | |
|  * @state:		[INTERN] the current state of the NAND device
 | |
|  * @page_shift:		[INTERN] number of address bits in a page (column address bits)
 | |
|  * @phys_erase_shift:	[INTERN] number of address bits in a physical eraseblock
 | |
|  * @bbt_erase_shift:	[INTERN] number of address bits in a bbt entry
 | |
|  * @chip_shift:		[INTERN] number of address bits in one chip
 | |
|  * @data_buf:		[INTERN] internal buffer for one page + oob
 | |
|  * @oob_buf:		[INTERN] oob buffer for one eraseblock
 | |
|  * @oobdirty:		[INTERN] indicates that oob_buf must be reinitialized
 | |
|  * @data_poi:		[INTERN] pointer to a data buffer
 | |
|  * @options:		[BOARDSPECIFIC] various chip options. They can partly be set to inform nand_scan about
 | |
|  *			special functionality. See the defines for further explanation
 | |
|  * @badblockpos:	[INTERN] position of the bad block marker in the oob area
 | |
|  * @numchips:		[INTERN] number of physical chips
 | |
|  * @chipsize:		[INTERN] the size of one chip for multichip arrays
 | |
|  * @pagemask:		[INTERN] page number mask = number of (pages / chip) - 1
 | |
|  * @pagebuf:		[INTERN] holds the pagenumber which is currently in data_buf
 | |
|  * @autooob:		[REPLACEABLE] the default (auto)placement scheme
 | |
|  * @bbt:		[INTERN] bad block table pointer
 | |
|  * @bbt_td:		[REPLACEABLE] bad block table descriptor for flash lookup
 | |
|  * @bbt_md:		[REPLACEABLE] bad block table mirror descriptor
 | |
|  * @badblock_pattern:	[REPLACEABLE] bad block scan pattern used for initial bad block scan
 | |
|  * @controller:		[OPTIONAL] a pointer to a hardware controller structure which is shared among multiple independend devices
 | |
|  * @priv:		[OPTIONAL] pointer to private chip date
 | |
|  */
 | |
| 
 | |
| struct nand_chip {
 | |
| 	void  __iomem	*IO_ADDR_R;
 | |
| 	void  __iomem	*IO_ADDR_W;
 | |
| 
 | |
| 	u_char		(*read_byte)(struct mtd_info *mtd);
 | |
| 	void		(*write_byte)(struct mtd_info *mtd, u_char byte);
 | |
| 	u16		(*read_word)(struct mtd_info *mtd);
 | |
| 	void		(*write_word)(struct mtd_info *mtd, u16 word);
 | |
| 
 | |
| 	void		(*write_buf)(struct mtd_info *mtd, const u_char *buf, int len);
 | |
| 	void		(*read_buf)(struct mtd_info *mtd, u_char *buf, int len);
 | |
| 	int		(*verify_buf)(struct mtd_info *mtd, const u_char *buf, int len);
 | |
| 	void		(*select_chip)(struct mtd_info *mtd, int chip);
 | |
| 	int		(*block_bad)(struct mtd_info *mtd, loff_t ofs, int getchip);
 | |
| 	int		(*block_markbad)(struct mtd_info *mtd, loff_t ofs);
 | |
| 	void		(*hwcontrol)(struct mtd_info *mtd, int cmd);
 | |
| 	int		(*dev_ready)(struct mtd_info *mtd);
 | |
| 	void		(*cmdfunc)(struct mtd_info *mtd, unsigned command, int column, int page_addr);
 | |
| 	int		(*waitfunc)(struct mtd_info *mtd, struct nand_chip *this, int state);
 | |
| 	int		(*calculate_ecc)(struct mtd_info *mtd, const u_char *dat, u_char *ecc_code);
 | |
| 	int		(*correct_data)(struct mtd_info *mtd, u_char *dat, u_char *read_ecc, u_char *calc_ecc);
 | |
| 	void		(*enable_hwecc)(struct mtd_info *mtd, int mode);
 | |
| 	void		(*erase_cmd)(struct mtd_info *mtd, int page);
 | |
| 	int		(*scan_bbt)(struct mtd_info *mtd);
 | |
| 	int		eccmode;
 | |
| 	int		eccsize;
 | |
| 	int		eccbytes;
 | |
| 	int		eccsteps;
 | |
| 	int		chip_delay;
 | |
| #if 0
 | |
| 	spinlock_t	chip_lock;
 | |
| 	wait_queue_head_t wq;
 | |
| 	nand_state_t	state;
 | |
| #endif
 | |
| 	int		page_shift;
 | |
| 	int		phys_erase_shift;
 | |
| 	int		bbt_erase_shift;
 | |
| 	int		chip_shift;
 | |
| 	u_char		*data_buf;
 | |
| 	u_char		*oob_buf;
 | |
| 	int		oobdirty;
 | |
| 	u_char		*data_poi;
 | |
| 	unsigned int	options;
 | |
| 	int		badblockpos;
 | |
| 	int		numchips;
 | |
| 	unsigned long	chipsize;
 | |
| 	int		pagemask;
 | |
| 	int		pagebuf;
 | |
| 	struct nand_oobinfo	*autooob;
 | |
| 	uint8_t		*bbt;
 | |
| 	struct nand_bbt_descr	*bbt_td;
 | |
| 	struct nand_bbt_descr	*bbt_md;
 | |
| 	struct nand_bbt_descr	*badblock_pattern;
 | |
| 	struct nand_hw_control	*controller;
 | |
| 	void		*priv;
 | |
| };
 | |
| 
 | |
| /*
 | |
|  * NAND Flash Manufacturer ID Codes
 | |
|  */
 | |
| #define NAND_MFR_TOSHIBA	0x98
 | |
| #define NAND_MFR_SAMSUNG	0xec
 | |
| #define NAND_MFR_FUJITSU	0x04
 | |
| #define NAND_MFR_NATIONAL	0x8f
 | |
| #define NAND_MFR_RENESAS	0x07
 | |
| #define NAND_MFR_STMICRO	0x20
 | |
| #define NAND_MFR_MICRON		0x2c
 | |
| 
 | |
| /**
 | |
|  * struct nand_flash_dev - NAND Flash Device ID Structure
 | |
|  *
 | |
|  * @name:	Identify the device type
 | |
|  * @id:		device ID code
 | |
|  * @pagesize:	Pagesize in bytes. Either 256 or 512 or 0
 | |
|  *		If the pagesize is 0, then the real pagesize
 | |
|  *		and the eraseize are determined from the
 | |
|  *		extended id bytes in the chip
 | |
|  * @erasesize:	Size of an erase block in the flash device.
 | |
|  * @chipsize:	Total chipsize in Mega Bytes
 | |
|  * @options:	Bitfield to store chip relevant options
 | |
|  */
 | |
| struct nand_flash_dev {
 | |
| 	char *name;
 | |
| 	int id;
 | |
| 	unsigned long pagesize;
 | |
| 	unsigned long chipsize;
 | |
| 	unsigned long erasesize;
 | |
| 	unsigned long options;
 | |
| };
 | |
| 
 | |
| /**
 | |
|  * struct nand_manufacturers - NAND Flash Manufacturer ID Structure
 | |
|  * @name:	Manufacturer name
 | |
|  * @id:		manufacturer ID code of device.
 | |
| */
 | |
| struct nand_manufacturers {
 | |
| 	int id;
 | |
| 	char * name;
 | |
| };
 | |
| 
 | |
| extern struct nand_flash_dev nand_flash_ids[];
 | |
| extern struct nand_manufacturers nand_manuf_ids[];
 | |
| 
 | |
| /**
 | |
|  * struct nand_bbt_descr - bad block table descriptor
 | |
|  * @options:	options for this descriptor
 | |
|  * @pages:	the page(s) where we find the bbt, used with option BBT_ABSPAGE
 | |
|  *		when bbt is searched, then we store the found bbts pages here.
 | |
|  *		Its an array and supports up to 8 chips now
 | |
|  * @offs:	offset of the pattern in the oob area of the page
 | |
|  * @veroffs:	offset of the bbt version counter in the oob are of the page
 | |
|  * @version:	version read from the bbt page during scan
 | |
|  * @len:	length of the pattern, if 0 no pattern check is performed
 | |
|  * @maxblocks:	maximum number of blocks to search for a bbt. This number of
 | |
|  *		blocks is reserved at the end of the device where the tables are
 | |
|  *		written.
 | |
|  * @reserved_block_code: if non-0, this pattern denotes a reserved (rather than
 | |
|  *		bad) block in the stored bbt
 | |
|  * @pattern:	pattern to identify bad block table or factory marked good /
 | |
|  *		bad blocks, can be NULL, if len = 0
 | |
|  *
 | |
|  * Descriptor for the bad block table marker and the descriptor for the
 | |
|  * pattern which identifies good and bad blocks. The assumption is made
 | |
|  * that the pattern and the version count are always located in the oob area
 | |
|  * of the first block.
 | |
|  */
 | |
| struct nand_bbt_descr {
 | |
| 	int	options;
 | |
| 	int	pages[NAND_MAX_CHIPS];
 | |
| 	int	offs;
 | |
| 	int	veroffs;
 | |
| 	uint8_t version[NAND_MAX_CHIPS];
 | |
| 	int	len;
 | |
| 	int	maxblocks;
 | |
| 	int	reserved_block_code;
 | |
| 	uint8_t *pattern;
 | |
| };
 | |
| 
 | |
| /* Options for the bad block table descriptors */
 | |
| 
 | |
| /* The number of bits used per block in the bbt on the device */
 | |
| #define NAND_BBT_NRBITS_MSK	0x0000000F
 | |
| #define NAND_BBT_1BIT		0x00000001
 | |
| #define NAND_BBT_2BIT		0x00000002
 | |
| #define NAND_BBT_4BIT		0x00000004
 | |
| #define NAND_BBT_8BIT		0x00000008
 | |
| /* The bad block table is in the last good block of the device */
 | |
| #define NAND_BBT_LASTBLOCK	0x00000010
 | |
| /* The bbt is at the given page, else we must scan for the bbt */
 | |
| #define NAND_BBT_ABSPAGE	0x00000020
 | |
| /* The bbt is at the given page, else we must scan for the bbt */
 | |
| #define NAND_BBT_SEARCH		0x00000040
 | |
| /* bbt is stored per chip on multichip devices */
 | |
| #define NAND_BBT_PERCHIP	0x00000080
 | |
| /* bbt has a version counter at offset veroffs */
 | |
| #define NAND_BBT_VERSION	0x00000100
 | |
| /* Create a bbt if none axists */
 | |
| #define NAND_BBT_CREATE		0x00000200
 | |
| /* Search good / bad pattern through all pages of a block */
 | |
| #define NAND_BBT_SCANALLPAGES	0x00000400
 | |
| /* Scan block empty during good / bad block scan */
 | |
| #define NAND_BBT_SCANEMPTY	0x00000800
 | |
| /* Write bbt if neccecary */
 | |
| #define NAND_BBT_WRITE		0x00001000
 | |
| /* Read and write back block contents when writing bbt */
 | |
| #define NAND_BBT_SAVECONTENT	0x00002000
 | |
| /* Search good / bad pattern on the first and the second page */
 | |
| #define NAND_BBT_SCAN2NDPAGE	0x00004000
 | |
| 
 | |
| /* The maximum number of blocks to scan for a bbt */
 | |
| #define NAND_BBT_SCAN_MAXBLOCKS 4
 | |
| 
 | |
| extern int nand_scan_bbt (struct mtd_info *mtd, struct nand_bbt_descr *bd);
 | |
| extern int nand_update_bbt (struct mtd_info *mtd, loff_t offs);
 | |
| extern int nand_default_bbt (struct mtd_info *mtd);
 | |
| extern int nand_isbad_bbt (struct mtd_info *mtd, loff_t offs, int allowbbt);
 | |
| extern int nand_erase_nand (struct mtd_info *mtd, struct erase_info *instr, int allowbbt);
 | |
| 
 | |
| /*
 | |
| * Constants for oob configuration
 | |
| */
 | |
| #define NAND_SMALL_BADBLOCK_POS		5
 | |
| #define NAND_LARGE_BADBLOCK_POS		0
 | |
| 
 | |
| #endif /* __LINUX_MTD_NAND_H */
 |