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	Add some tests of driver model functionality. Coverage includes: - basic init - binding of drivers to devices using platform_data - automatic probing of devices when referenced - availability of platform data to devices - lifecycle from bind to probe to remove to unbind - renumbering within a uclass when devices are probed/removed - calling driver-defined operations - deactivation of drivers when removed - memory leak across creation and destruction of drivers/uclasses - uclass init/destroy methods - automatic probe/remove of children/parents when needed This function is enabled for sandbox, using CONFIG_DM_TEST. Signed-off-by: Simon Glass <sjg@chromium.org>
		
			
				
	
	
		
			34 lines
		
	
	
		
			706 B
		
	
	
	
		
			C
		
	
	
	
	
	
			
		
		
	
	
			34 lines
		
	
	
		
			706 B
		
	
	
	
		
			C
		
	
	
	
	
	
| /*
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|  * Simple unit test library for driver model
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|  *
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|  * Copyright (c) 2013 Google, Inc
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|  *
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|  * SPDX-License-Identifier:	GPL-2.0+
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|  */
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| 
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| #include <common.h>
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| #include <dm/test.h>
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| #include <dm/ut.h>
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| 
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| struct dm_test_state;
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| 
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| void ut_fail(struct dm_test_state *dms, const char *fname, int line,
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| 	     const char *func, const char *cond)
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| {
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| 	printf("%s:%d, %s(): %s\n", fname, line, func, cond);
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| 	dms->fail_count++;
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| }
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| 
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| void ut_failf(struct dm_test_state *dms, const char *fname, int line,
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| 	      const char *func, const char *cond, const char *fmt, ...)
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| {
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| 	va_list args;
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| 
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| 	printf("%s:%d, %s(): %s: ", fname, line, func, cond);
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| 	va_start(args, fmt);
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| 	vprintf(fmt, args);
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| 	va_end(args);
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| 	putc('\n');
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| 	dms->fail_count++;
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| }
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