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	This commit adds unit tests for ADC uclass's methods using sandbox ADC. Testing proper ADC binding: - dm_test_adc_bind() - device binding - dm_test_adc_wrong_channel_selection() - checking wrong channel selection Testing ADC supply operations: - dm_test_adc_supply(): - Vdd/Vss values validating - Vdd regulator updated value validating - Vdd regulator's auto enable state validating Testing ADC operations results: - dm_test_adc_single_channel_conversion() - single channel start/data - dm_test_adc_single_channel_shot() - single channel shot - dm_test_adc_multi_channel_conversion() - multi channel start/data - dm_test_adc_multi_channel_shot() - multi channel single shot Signed-off-by: Przemyslaw Marczak <p.marczak@samsung.com> Cc: Simon Glass <sjg@chromium.org> Signed-off-by: Minkyu Kang <mk7.kang@samsung.com>
		
			
				
	
	
		
			166 lines
		
	
	
		
			4.8 KiB
		
	
	
	
		
			C
		
	
	
	
	
	
			
		
		
	
	
			166 lines
		
	
	
		
			4.8 KiB
		
	
	
	
		
			C
		
	
	
	
	
	
| /*
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|  * Tests for the driver model ADC API
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|  *
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|  * Copyright (c) 2015 Samsung Electronics
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|  * Przemyslaw Marczak <p.marczak@samsung.com>
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|  *
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|  * SPDX-License-Identifier:	GPL-2.0+
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|  */
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| 
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| #include <common.h>
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| #include <adc.h>
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| #include <dm.h>
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| #include <dm/root.h>
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| #include <dm/util.h>
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| #include <dm/test.h>
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| #include <errno.h>
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| #include <fdtdec.h>
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| #include <power/regulator.h>
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| #include <power/sandbox_pmic.h>
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| #include <sandbox-adc.h>
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| #include <test/ut.h>
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| 
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| DECLARE_GLOBAL_DATA_PTR;
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| 
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| static int dm_test_adc_bind(struct unit_test_state *uts)
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| {
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| 	struct udevice *dev;
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| 
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| 	ut_assertok(uclass_get_device_by_name(UCLASS_ADC, "adc", &dev));
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| 	ut_asserteq_str(SANDBOX_ADC_DEVNAME, dev->name);
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| 
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| 	return 0;
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| }
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| DM_TEST(dm_test_adc_bind, DM_TESTF_SCAN_FDT);
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| 
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| static int dm_test_adc_wrong_channel_selection(struct unit_test_state *uts)
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| {
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| 	struct udevice *dev;
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| 
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| 	ut_assertok(uclass_get_device_by_name(UCLASS_ADC, "adc", &dev));
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| 	ut_asserteq(-EINVAL, adc_start_channel(dev, SANDBOX_ADC_CHANNELS));
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| 
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| 	return 0;
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| }
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| DM_TEST(dm_test_adc_wrong_channel_selection, DM_TESTF_SCAN_FDT);
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| 
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| static int dm_test_adc_supply(struct unit_test_state *uts)
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| {
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| 	struct udevice *supply;
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| 	struct udevice *dev;
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| 	int uV;
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| 
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| 	ut_assertok(uclass_get_device_by_name(UCLASS_ADC, "adc", &dev));
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| 
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| 	/* Test Vss value - predefined 0 uV */
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| 	ut_assertok(adc_vss_value(dev, &uV));
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| 	ut_asserteq(SANDBOX_ADC_VSS_VALUE, uV);
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| 
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| 	/* Test Vdd initial value - buck2 */
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| 	ut_assertok(adc_vdd_value(dev, &uV));
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| 	ut_asserteq(SANDBOX_BUCK2_INITIAL_EXPECTED_UV, uV);
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| 
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| 	/* Change Vdd value - buck2 manual preset */
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| 	ut_assertok(regulator_get_by_devname(SANDBOX_BUCK2_DEVNAME, &supply));
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| 	ut_assertok(regulator_set_value(supply, SANDBOX_BUCK2_SET_UV));
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| 	ut_asserteq(SANDBOX_BUCK2_SET_UV, regulator_get_value(supply));
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| 
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| 	/* Update ADC platdata and get new Vdd value */
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| 	ut_assertok(adc_vdd_value(dev, &uV));
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| 	ut_asserteq(SANDBOX_BUCK2_SET_UV, uV);
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| 
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| 	/* Disable buck2 and test ADC supply enable function */
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| 	ut_assertok(regulator_set_enable(supply, false));
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| 	ut_asserteq(false, regulator_get_enable(supply));
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| 	/* adc_start_channel() should enable the supply regulator */
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| 	ut_assertok(adc_start_channel(dev, 0));
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| 	ut_asserteq(true, regulator_get_enable(supply));
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| 
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| 	return 0;
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| }
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| DM_TEST(dm_test_adc_supply, DM_TESTF_SCAN_FDT);
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| 
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| struct adc_channel adc_channel_test_data[] = {
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| 	{ 0, SANDBOX_ADC_CHANNEL0_DATA },
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| 	{ 1, SANDBOX_ADC_CHANNEL1_DATA },
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| 	{ 2, SANDBOX_ADC_CHANNEL2_DATA },
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| 	{ 3, SANDBOX_ADC_CHANNEL3_DATA },
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| };
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| 
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| static int dm_test_adc_single_channel_conversion(struct unit_test_state *uts)
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| {
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| 	struct adc_channel *tdata = adc_channel_test_data;
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| 	unsigned int i, data;
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| 	struct udevice *dev;
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| 
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| 	ut_assertok(uclass_get_device_by_name(UCLASS_ADC, "adc", &dev));
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| 	/* Test each ADC channel's value */
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| 	for (i = 0; i < SANDBOX_ADC_CHANNELS; i++, tdata++) {
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| 		ut_assertok(adc_start_channel(dev, tdata->id));
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| 		ut_assertok(adc_channel_data(dev, tdata->id, &data));
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| 		ut_asserteq(tdata->data, data);
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| 	}
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| 
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| 	return 0;
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| }
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| DM_TEST(dm_test_adc_single_channel_conversion, DM_TESTF_SCAN_FDT);
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| 
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| static int dm_test_adc_multi_channel_conversion(struct unit_test_state *uts)
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| {
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| 	struct adc_channel channels[SANDBOX_ADC_CHANNELS];
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| 	struct udevice *dev;
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| 	struct adc_channel *tdata = adc_channel_test_data;
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| 	unsigned int i, channel_mask;
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| 
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| 	channel_mask = ADC_CHANNEL(0) | ADC_CHANNEL(1) |
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| 		       ADC_CHANNEL(2) | ADC_CHANNEL(3);
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| 
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| 	/* Start multi channel conversion */
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| 	ut_assertok(uclass_get_device_by_name(UCLASS_ADC, "adc", &dev));
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| 	ut_assertok(adc_start_channels(dev, channel_mask));
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| 	ut_assertok(adc_channels_data(dev, channel_mask, channels));
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| 
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| 	/* Compare the expected and returned conversion data. */
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| 	for (i = 0; i < SANDBOX_ADC_CHANNELS; i++, tdata++)
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| 		ut_asserteq(tdata->data, channels[i].data);
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| 
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| 	return 0;
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| }
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| DM_TEST(dm_test_adc_multi_channel_conversion, DM_TESTF_SCAN_FDT);
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| 
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| static int dm_test_adc_single_channel_shot(struct unit_test_state *uts)
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| {
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| 	struct adc_channel *tdata = adc_channel_test_data;
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| 	unsigned int i, data;
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| 
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| 	for (i = 0; i < SANDBOX_ADC_CHANNELS; i++, tdata++) {
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| 		/* Start single channel conversion */
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| 		ut_assertok(adc_channel_single_shot("adc", tdata->id, &data));
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| 		/* Compare the expected and returned conversion data. */
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| 		ut_asserteq(tdata->data, data);
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| 	}
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| 
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| 	return 0;
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| }
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| DM_TEST(dm_test_adc_single_channel_shot, DM_TESTF_SCAN_FDT);
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| 
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| static int dm_test_adc_multi_channel_shot(struct unit_test_state *uts)
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| {
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| 	struct adc_channel channels[SANDBOX_ADC_CHANNELS];
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| 	struct adc_channel *tdata = adc_channel_test_data;
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| 	unsigned int i, channel_mask;
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| 
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| 	channel_mask = ADC_CHANNEL(0) | ADC_CHANNEL(1) |
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| 		       ADC_CHANNEL(2) | ADC_CHANNEL(3);
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| 
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| 	/* Start single call and multi channel conversion */
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| 	ut_assertok(adc_channels_single_shot("adc", channel_mask, channels));
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| 
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| 	/* Compare the expected and returned conversion data. */
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| 	for (i = 0; i < SANDBOX_ADC_CHANNELS; i++, tdata++)
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| 		ut_asserteq(tdata->data, channels[i].data);
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| 
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| 	return 0;
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| }
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| DM_TEST(dm_test_adc_multi_channel_shot, DM_TESTF_SCAN_FDT);
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